icm92

ABIDA at TNEARN.bitnet ABIDA at TNEARN.bitnet
Wed Feb 5 09:29:00 EST 1992



                                icm'92

                           CALL FOR PAPERS

          THE INTERNATIONAL CONFERENCE ON MICROELECTRONICS
                                Monastir, Tunisia
                               December 19-21, 1992


GENERAL SCOPE:

        DESIGN AND COMPUTER-AIDED DESIGN FOR MICROELECTRONICS

        -       Simulation (process, device, circuit, logic, timing,functional)
        -       Layout (placement, routing, floorplannig, symbolic, ERC, DRC).
        -       Test (generation, testability, built-in test, simulation).
        -       Systems (design synthesis, compilation, expert systems, tool in
                tegration, hardware acceleration, CAD systems).

        DESIGN AND APPLICATION OF INTEGRATED CIRCUITS

        -       Custom and semi-custom circuits (design concepts, architectures
                and high-performance circuits).
        -       Digital Signal and Data Processing.
        -       Analog circuit techniques.
        -       Testing.
        -       Integrated circuit applications.

        MICROELECTRONICS TECHNOLOGY

        -       Device characterization and modeling.
        -       Device physics and novel structures.
        -       Materials and material characterization techniques
        -       Process technology, CMOS, bopolar, BICMOS, GaAs
        -       Reliability.
        -       Radiation effects.
        -       Packaging

SUBMISSION OF PAPERS:
LANGUAGE:      English
Author(s) should submit by May 1, 1992, three (3) copies of a 35-word Abstract
and a 500 word summary which will be used to select the papers for the conferen
ce. The area of the paper (selected from the list under SCOPE) must be indicate
d. The main result


For Europe and North America:                   For other areas:

Prof. M. I. Elmasry                                     Prof. R. Tourki
Director, VLSI Research Group                   Faculte des Sciences
ECE Department                                  Route de Kairouan
University of Waterloo                          5000 Monastir
Waterloo, ON, N2L 3G1, CANADA                   Tunisia
Phone: (519)885- 1211, Ext. 3753                        Phone: (216)3.61.766
Telex: 069-55259                                        Telex: 30. 816STEMO
FAX: (519)746-5195                                      FAX: (216)3.62873
e_mail: elmasry a vlsi. uwaterloo.ca

CORRESPONDENCE:
For any further information and/or to be placed on the mailing list, write to
the chairman of the local organizing committee:
                Dr. Mohamed ABID
                Departement d'informatique industrielle
                ENIM 5000 MONASTIR, TUNISIA
                Phone: (216) 3. 64703, 64704, 64705
                Telex: (216) 3. 30816
                FAX: (216) 3. 61900/3.62873

LOCAL ORGANIZING COMMITTEE:
K. Besbes,  F. Chkir,  Mme Ben Amara,  H. Ben Naceur,  M. Chouchane,  A. Dogui,
 S. Gnenna,  M. Masmoudi,  s. Nasri

TECHNICAL PROGRAM COMMITTEE:
A.K. Abouelsaud, Alexandria University, Egypt   A. Ibrahim, Xerox, USA
M. Annabi, INRST, Tunisia               M. Ibrahim, Ain Shams University,Egypt
A. Armanazi, SSTC, Syria                A.A. Kamal, Cairo University, Egypt
H. Bessalah, CTDA, Algeria                      M. Ksouri, ENIT, Tunisia
A. Bouallegue, ENIT, Tunisia                    N. Lakhaoua, ENIS, Tunisia
J.P. Chante, INSA, France                       H. Maaref, FSM, Tunisia
B. Courtois, CMP/Eurochip, France               A. Mohsen, Connectus, USA
M. Declercq, EPFL, Switzerland             S. Moustafa, Helwan University, Egypt
R. Dutton, Stanford University, USA             A. Naem, NTE, Canada
N.A. Eldeeb, Military Tech. College, Egypt    R. Newton, Univ. of Califomia, USA
A.G. Eldin, University of Calgary, Canada       A. Ouali, ENIS, Tunisia
A. El-Gamal, Stanford University, USA   M.N. Saleh, Ain Shams University, Egypt
B. Eljani, FSM, Tunisia                 A. Sedra, University of Toronto, Canada
N. Ellouze, IRSIT, Tunisia              M.M. Shabana,Alexandria Universit Egypt
Y. El- Mansy, Intel, USA                E.A. Talkan, Cairo University, Egypt
M. Elsaid, Ain Shams University, Egypt  M. Zaghloyl, Geo.Washington Univ., USA
S. Foda, Ryerson polytechnical, Canada

SOCIAL PROGRAM; spend your holidays in Tunisia:
A variety of social activites are being planned. The participants and their gue
sts will be introduced to the culture of the host country through pre-arranged
 tours.




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