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<html><body style="word-wrap: break-word; -webkit-nbsp-mode: space; -webkit-line-break: after-white-space; "><div style="word-wrap: break-word; -webkit-nbsp-mode: space; -webkit-line-break: after-white-space; "><div style="word-wrap: break-word; -webkit-nbsp-mode: space; -webkit-line-break: after-white-space; "><div style="word-wrap: break-word; -webkit-nbsp-mode: space; -webkit-line-break: after-white-space; ">--- PLEASE APOLOGIZE IF YOU RECEIVE MULTIPLE COPIES OF THIS MESSAGE ---</div><div style="word-wrap: break-word; -webkit-nbsp-mode: space; -webkit-line-break: after-white-space; "><br></div><div style="word-wrap: break-word; -webkit-nbsp-mode: space; -webkit-line-break: after-white-space; ">Conference Electronic Imaging / Wavelet Applications in Industrial Processing VII<br>San Jose, CA USA<br>17-21 January 2010<br><br></div><div style="word-wrap: break-word; -webkit-nbsp-mode: space; -webkit-line-break: after-white-space; "><br>Part of program track on Image Processing<br><a href="http://spie.org//app/program/index.cfm?fuseaction=conferencedetail&export_id=x16280&ID=x16223&redir=x16223.xml&conference_id=894727&event_id=893861&programtrack_id=896670&jsenabled=1">http://spie.org//app/program/index.cfm?fuseaction=conferencedetail&export_id=x16280&ID=x16223&redir=x16223.xml&conference_id=894727&event_id=893861&programtrack_id=896670&jsenabled=1</a><br><br>You can submit your abstract (500 words or more) on the website or you can send it to the chairs.</div><div style="word-wrap: break-word; -webkit-nbsp-mode: space; -webkit-line-break: after-white-space; "><br></div><div style="word-wrap: break-word; -webkit-nbsp-mode: space; -webkit-line-break: after-white-space; "><br>Post-Meeting Proceedings Due Dates:<div><br>Abstract (500 words or more) : 15 July 2009<br>Manuscript : 21 December 2009<br><br><br>Conference Chairs:<br>Frederic Truchetet, Univ. de Bourgogne (France); Olivier Laligant, Univ. de Bourgogne (France)<br>Program Committee:<br>Patrice Abry, École Normale Supérieure de Lyon (France); Akram Aldroubi, Vanderbilt Univ. (United States); </div><div>Jean-Pierre Antoine, Univ. Catholique de Louvain (Belgium); Radu V. Balan, Univ. of Maryland, College Park (United States); </div><div>Atilla M. Baskurt, Univ. Claude Bernard Lyon 1 (France); Amel Benazza-Benyahia, Ecole Supérieure des Communications de Tunis (Tunisia); </div><div>Albert Bijaoui, Observatoire de la Côte d'Azur (France); Laurent C. Duval, Institut Français du Pétrole (France); </div><div>Wilfried R. Philips, Aleksandra Pizurica, Univ. Gent (Belgium); Guoping Qiu, The Univ. of Nottingham (United Kingdom); </div><div>Hamed Sari-Sarraf, Texas Tech Univ. (United States); Peter Schelkens, Vrije Univ. Brussel (Belgium); </div><div>Paul Scheunders, Univ. Antwerpen (Belgium); Ivan W. Selesnick, Polytechnic Institute of NYU (United States); </div><div>Kenneth W. Tobin, Jr., Oak Ridge National Lab. (United States); Günther K. G. Wernicke, Humboldt-Univ. zu Berlin (Germany); </div><div>Gerald Zauner, Fachhochschule Wels (Austria)<br><br><br><br>The wavelet transform, multiresolution analysis, EMD, and other space-frequency or space-scale approaches are now considered standard tools by researchers in image and signal processing. Promising practical results in machine vision and sensors for industrial applications and non destructive testing have been obtained, and a lot of ideas can be applied to industrial imaging projects.<br><br>This conference is intended to bring together practitioners, researchers, and technologists in machine vision, sensors, non destructive testing, signal and image processing to share recent developments in wavelet and multiresolution approaches. Papers emphasizing fundamental methods that are widely applicable to image processing, industrial inspection and other industrial applications are especially welcome.<br><br>Papers are solicited but not limited to the following areas: New trends in wavelet and multiresolution approach, frame and overcomplete representations, Gabor transform, space-scale and space-frequency analysis, multiwavelets, directional wavelets, lifting scheme, empirical mode decomposition for:<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>sensors<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>signal and image denoising, enhancement, segmentation, image deblurring<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>texture analysis<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>pattern recognition<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>shape recognition<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>3D surface analysis, characterization, compression<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>acoustical signal processing<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>stochastic signal analysis<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>seismic data analysis<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>real-time implementation<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>image compression<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>hardware, wavelet chips<br>Applications:<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>machine vision<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>aspect inspection<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>character recognition<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>speech enhancement<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>robot vision<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>image databases<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>image indexing or retrieval<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>data hiding<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>image watermarking<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>non destructive evaluation<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>metrology<br><span class="Apple-tab-span" style="white-space: pre; "> </span>•<span class="Apple-tab-span" style="white-space: pre; "> </span>real-time inspection.<br><br>Applications in microelectronics manufacturing, web and paper products, glass, plastic, steel, inspection, power production, chemical process, food and agriculture, pharmaceuticals, petroleum industry.<br><br>Note: All submissions will be peer reviewed. Please note that abstracts must be at least 500 words in length in order to receive full consideration.</div></div></div></div></body></html>
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