Conference Electronic Imaging / Wavelet Applications in Industrial =20
Processing VII
San Jose, CA USA
17-21 January 2010
Part of program track on Image Processing
=
http://spie.org//app/program/index.cfm?fuseaction=3Dconferencedetail&expor=
t_id=3Dx16280&ID=3Dx16223&redir=3Dx16223.xml&conference_id=3D894727&event_=
id=3D893861&programtrack_id=3D896670&jsenabled=3D1
Post-Meeting Proceedings Due Dates:
Extended Abstract (3-4 pages) and Summary (200 words) : 22 June 2009
Manuscript : 21 December 2009
Conference Chairs:
Frederic Truchetet, Univ. de Bourgogne (France); Olivier Laligant, =20
Univ. de Bourgogne (France)
Program Committee:
Patrice Abry, =C9cole Normale Sup=E9rieure de Lyon (France); Akram =20
Aldroubi, Vanderbilt Univ. (United States);
Jean-Pierre Antoine, Univ. Catholique de Louvain (Belgium); Radu V. =20
Balan, Univ. of Maryland, College Park (United States);
Atilla M. Baskurt, Univ. Claude Bernard Lyon 1 (France); Amel Benazza-=20=
Benyahia, Ecole Sup=E9rieure des Communications de Tunis (Tunisia);
Albert Bijaoui, Observatoire de la C=F4te d'Azur (France); Laurent C. =20=
Duval, Institut Fran=E7ais du P=E9trole (France);
Wilfried R. Philips, Aleksandra Pizurica, Univ. Gent (Belgium); =20
Guoping Qiu, The Univ. of Nottingham (United Kingdom);
Hamed Sari-Sarraf, Texas Tech Univ. (United States); Peter Schelkens, =20=
Vrije Univ. Brussel (Belgium);
Paul Scheunders, Univ. Antwerpen (Belgium); Ivan W. Selesnick, =20
Polytechnic Institute of NYU (United States);
Kenneth W. Tobin, Jr., Oak Ridge National Lab. (United States); =20
G=FCnther K. G. Wernicke, Humboldt-Univ. zu Berlin (Germany);
Gerald Zauner, Fachhochschule Wels (Austria)
The wavelet transform, multiresolution analysis, EMD, and other space-=20=
frequency or space-scale approaches are now considered standard tools =20=
by researchers in image and signal processing. Promising practical =20
results in machine vision and sensors for industrial applications and =20=
non destructive testing have been obtained, and a lot of ideas can be =20=
applied to industrial imaging projects.
This conference is intended to bring together practitioners, =20
researchers, and technologists in machine vision, sensors, non =20
destructive testing, signal and image processing to share recent =20
developments in wavelet and multiresolution approaches. Papers =20
emphasizing fundamental methods that are widely applicable to image =20
processing, industrial inspection and other industrial applications =20
are especially welcome.
Papers are solicited but not limited to the following areas: New =20
trends in wavelet and multiresolution approach, frame and overcomplete =20=
representations, Gabor transform, space-scale and space-frequency =20
analysis, multiwavelets, directional wavelets, lifting scheme, =20
empirical mode decomposition for:
=95 sensors
=95 signal and image denoising, enhancement, segmentation, =
image =20
deblurring
=95 texture analysis
=95 pattern recognition
=95 shape recognition
=95 3D surface analysis, characterization, compression
=95 acoustical signal processing
=95 stochastic signal analysis
=95 seismic data analysis
=95 real-time implementation
=95 image compression
=95 hardware, wavelet chips
Applications:
=95 machine vision
=95 aspect inspection
=95 character recognition
=95 speech enhancement
=95 robot vision
=95 image databases
=95 image indexing or retrieval
=95 data hiding
=95 image watermarking
=95 non destructive evaluation
=95 metrology
=95 real-time inspection.
Applications in microelectronics manufacturing, web and paper =20
products, glass, plastic, steel, inspection, power production, =20
chemical process, food and agriculture, pharmaceuticals, petroleum =20
industry.
Note: All submissions will be peer reviewed. Please note that =20
abstracts must be at least 3-4 pages in length in order to receive =20
full consideration.
--- PLEASE APOLOGIZE IF YOU RECEIVE MULTIPLE COPIES OF THIS MESSAGE ---=
