[Computational-biology] Call for papers : Wavelet Applications in Industrial Processing VII - San Jose USA, January 2010

[wavelet]

Conference Electronic Imaging / Wavelet Applications in Industrial =20
Processing VII
San Jose, CA USA
17-21 January 2010


Part of program track on Image Processing
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Post-Meeting Proceedings Due Dates:

Extended Abstract (3-4 pages) and Summary (200 words) : 22 June 2009
Manuscript : 21 December 2009


Conference Chairs:
Frederic Truchetet, Univ. de Bourgogne (France); Olivier Laligant, =20
Univ. de Bourgogne (France)
Program Committee:
Patrice Abry, =C9cole Normale Sup=E9rieure de Lyon (France); Akram =20
Aldroubi, Vanderbilt Univ. (United States);
Jean-Pierre Antoine, Univ. Catholique de Louvain (Belgium); Radu V. =20
Balan, Univ. of Maryland, College Park (United States);
Atilla M. Baskurt, Univ. Claude Bernard Lyon 1 (France); Amel Benazza-=20=

Benyahia, Ecole Sup=E9rieure des Communications de Tunis (Tunisia);
Albert Bijaoui, Observatoire de la C=F4te d'Azur (France); Laurent C. =20=

Duval, Institut Fran=E7ais du P=E9trole (France);
Wilfried R. Philips, Aleksandra Pizurica, Univ. Gent (Belgium); =20
Guoping Qiu, The Univ. of Nottingham (United Kingdom);
Hamed Sari-Sarraf, Texas Tech Univ. (United States); Peter Schelkens, =20=

Vrije Univ. Brussel (Belgium);
Paul Scheunders, Univ. Antwerpen (Belgium); Ivan W. Selesnick, =20
Polytechnic Institute of NYU (United States);
Kenneth W. Tobin, Jr., Oak Ridge National Lab. (United States); =20
G=FCnther K. G. Wernicke, Humboldt-Univ. zu Berlin (Germany);
Gerald Zauner, Fachhochschule Wels (Austria)



The wavelet transform, multiresolution analysis, EMD, and other space-=20=

frequency or space-scale approaches are now considered standard tools =20=

by researchers in image and signal processing. Promising practical =20
results in machine vision and sensors for industrial applications and =20=

non destructive testing have been obtained, and a lot of ideas can be =20=

applied to industrial imaging projects.

This conference is intended to bring together practitioners, =20
researchers, and technologists in machine vision, sensors, non =20
destructive testing, signal and image processing to share recent =20
developments in wavelet and multiresolution approaches. Papers =20
emphasizing fundamental methods that are widely applicable to image =20
processing, industrial inspection and other industrial applications =20
are especially welcome.

Papers are solicited but not limited to the following areas: New =20
trends in wavelet and multiresolution approach, frame and overcomplete =20=

representations, Gabor transform, space-scale and space-frequency =20
analysis, multiwavelets, directional wavelets, lifting scheme, =20
empirical mode decomposition for:
	=95	sensors
	=95	signal and image denoising, enhancement, segmentation, =
image =20
deblurring
	=95	texture analysis
	=95	pattern recognition
	=95	shape recognition
	=95	3D surface analysis, characterization, compression
	=95	acoustical signal processing
	=95	stochastic signal analysis
	=95	seismic data analysis
	=95	real-time implementation
	=95	image compression
	=95	hardware, wavelet chips
Applications:
	=95	machine vision
	=95	aspect inspection
	=95	character recognition
	=95	speech enhancement
	=95	robot vision
	=95	image databases
	=95	image indexing or retrieval
	=95	data hiding
	=95	image watermarking
	=95	non destructive evaluation
	=95	metrology
	=95	real-time inspection.

Applications in microelectronics manufacturing, web and paper =20
products, glass, plastic, steel, inspection, power production, =20
chemical process, food and agriculture, pharmaceuticals, petroleum =20
industry.

Note: All submissions will be peer reviewed. Please note that =20
abstracts must be at least 3-4 pages in length in order to receive =20
full consideration.


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