New Image Plate System

Graheme Williams williams at delftny.com
Tue May 24 10:53:29 EST 1994


	This announcement is being re-posted because I didn't do it right the
first time in order to get the proper distribution.  Apologies to the small 
number of subscribers who may get this for a second time.  =GJBW=


                            Image Plate Systems

Image plate technology provides large-size area detectors for the collection of
X-ray diffraction data with demonstrated excellent performance in the rapid 
acquisition of high-resolution information.  Enraf-Nonius' offered systems
feature the highly advantageous spiral readout methodology and a dual plate
implementation which approaches a 100% duty cycle. Several models are available
for integration with a wide range of X-ray sources and computer systems.  All
models include a graphite monochromator but may be ordered with focussing
mirrors. The sample to detector distance can be set over the range of 35 - 250
mm.  A scintillation counter for X-ray beam alignment is included and a sample
orienting microscope is provided.  An intelligent microprocessor controls
instrument functions from host commands. Both oscillation-photo and
pseudo-Weissenberg techniques are supported. 

Model               Features                                

DIP-2020       Dual 20cm image plates,single axis orienter,
               single photon sensitivity, 80micron pixel size,
               dmin = 1.33A at D=3.5 cm with CuKa radiation.
          
DIP-2020K      Dual 20cm image plates,Kappa-axis goniometer,
               single photon sensitivity, 80micron pixel size,
               dmin = 1.33A at D=3.5 cm with CuKa radiation.

DIP-2030       Dual 30cm image plates, single axis orienter,
               single photon sensitivity, 80micron pixel size,
               dmin = 1.24A at D=3.5 cm with CuKa radiation.

DIP-2030K      Dual 30cm image plates, Kappa-axis goniometer,
               single photon sensitivity, 80micron pixel size,
               dmin = 1.24A at D=3.5 cm with CuKa radiation.

Mirrors        Dual Mirror system to monochromate and focus
               primary beam.

He-tunnel      Diffracted beam tunnel, may be Helium filled.

DIP systems are provided with a hardware interface for either a Sun or Silicon
Graphics computer system.  Software control of all data-collection procedures
with the systems' hardware are supported. The MAC-DENZO suite of programs for
reflection search, auto-index, refinement, data reduction, scaling and merging
is provided.

EEEE N   N Graheme J.B. Williams, :   E. N.                        :EEEE N   N
E    NN  N Enraf-Nonius Company,NY:       has                      :E    NN  N
EEE  N N N 390 Central Ave,       :     Everything  Nice!          :EEE  N N N
E    N  NN Bohemia, NY, 11716-3147: e-mail; williams at delftny.com   :E    N  NN
EEEE N   N tel; (516)-589-2885 X40: fax;    (516)589-2068          :EEEE N   N


Nonius B.V., Delft, P.O. Box 811, 2624 AV Delft, The Netherlands,
Tel.: 31 15 698 300, Fax.: 31 15 627 401

Enraf-Nonius Co.,390 Central Ave, Bohemia, NY, 11716-USA,
Tel.: 516 589 2885, Fax:.516 589 2068

Enraf-Nonius Ltd. Highview House, 165 Station Rd., Edgware,HA8 7JU, England,
Tel.: 44 81 952 1643, Fax.: 44 81 951 1463

Enraf-Nonius GmbH, Postfach 101 023, 42648, Solingen, Germany,
Tel.:49 212 587 50, Fax.: 49 212 587 549

Enraf-Nonius SA, 28 ter Avenue des Versailles, 93220, Gagny, France,
Tel.: 33 14 509 0404, Fax.:33 14 509 2287





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